Park Systems, World-Leader in Atomic Force Microscopes Invites Semicon West Attendees and Customers to Annual Semicon West AFM Luncheon

Park NX Wafer Low Noise, High Throughput Automatic Force Profiler with Automatic Defect Review

Park continues to produce cost saving value proposition innovations for semiconductor manufacturers such as the Park NX-Wafer, designed specifically for the semiconductor industry and improving productivity by up to 1000%

Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 is hosting a free AFM Luncheon for all SEMICONWest attendees and Park customers on July 11, 2017 from 12-2pm at the Thirsty Bear Brewing Company. The luncheon will feature talks from Dr. Sang-il Park, Chairman & CEO of Park Systems, and Prof. Krishna Saraswat, Rickey/Nielsen Professor in the School of Engineering at Stanford University.To register for the luncheon, go to:

Park Systems will exhibit their Atomic Force Microscopes featuring revolutionary Park SmartScan™ automation and True Non-Contact™ in booth 5433 at SEMICON West, the premier annual event for the global microelectronics industry with an expected attendance of over 25,000 visitors.

“Our partnership with many leading semiconductor institutions such as imec and Stanford provides a crucial link of scientific collaboration throughout the chain of suppliers and vendors in semiconductor wafer production creating significant technological advances in AFM-based inline nanoscale metrology,” stated Dr. Sang-il Park, CEO of Park Systems. “We are excited to showcase these advances at this year’s Semicon West show and give highlights at our AFM luncheon.”

The annual Semicon West Park AFM luncheon offers an exciting chance to network with other attendees and hear from two industry pioneers at this informal gathering.

Dr. Sang-il Park, Founder and…

Read the full article from the Source…

Leave a Reply

Your email address will not be published. Required fields are marked *